Hallberg Independent Research

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Some of the papers have direct links to pdf-files.

You can also visit a Reliability Management page for a summary of each paper and links to pdf:s.

1. Hallberg Ö. Termisk utmattning av Al-bondtrådar genom strömpulsning. SINTOM, Köpenhamn, 16-18 april 1975
2. Hallberg Ö. Failure-rate as a function of time due to log-normal life distribution(s) of weak parts. Pergamon Press, Microelectronics and Reliability. 1977;16(2):55-158. (Abstr)
3. Hallberg Ö. Acceleration factors for temperature-humidity testing of Al-metallized semiconductors. Proc SINTOM seminar, Sept 4-6, 1979, Electronikcentralen, Copenhagen, Denmark.
4. Hallberg Ö. NMOS voltage breakdown characteristics compared with accelerated life tests and field use data, International Reliability Physics Symposium, IEEE Proc 1981, pp28-32
5. Hultén, Hallberg Ö. Evaluation of a parasitic charge-spreading transistor as a moisture sensor, RADC/NBS International Workshop Moisture Measurement and Control for Microelectronics (IV), Nov. 12-14, 1986, Washington DC, NBSIR 87-3588 pp189-195
6. Hallberg Ö, Analysis of field failure data from growing populations. Proc SINTOM seminar April 27-29 1987, Visby, Sweden-
7. Hallberg Ö, Peck DS, Recent humidity accelerations, a base for testing standards, Quality and Reliability Engineering International, Vol. 7, 169-180 (1991)
8. Hallberg Ö. Humidity Accelerations for Testing Standards (invited paper), European Symposium Reliability of Electron Devices, Failure Physics and Analysis (ESREF), 1992
9. Hallberg Ö et al. Hardware reliability assurance and field experience in a telecom environment, Quality and Reliability Engineering International, Vol. 10, 195-200 (1994)
10. Hallberg Ö. Facts amd Fiction about the Reliability of Electronics, (invited paper), ESREF 1995, Bordeaux, pp 39-46
11. Hallberg Ö. Qualification of Components and Equipment in a new Era, Proc Reliability Challenge symposium, London, 1996, Finn Jensen Reliability consultancy aps, Holte, Denmark.
12. Nilsson M, Hallberg Ö. A new reliability prediction model for telecommunication hardware, ESREF 1997, Bordeaux, Microelectron. Reliab. Vol 37, No 10/11 pp 1429-1432. (Abstr)
13. Oscarsson P, Hallberg Ö. EriView 2000 - A tool for the analysis of field statistics, Proc ESREL, pp 1083-1090, Lisboa, 1997 ISBN 0-08-042835-5
14. Hallberg Ö. Failure free electronic - a reliability challenge, Proc Reliability Challenge symposium, Dublin 1998.
15. Hallberg Ö, Löfberg J. A time dependent field return mode for telecommunication hardware, EEP-Vol. 26-2, Advances in Electronic Packaging, Vol 2 ASME, Mauri, 1999, pp 1769-1774.
16. Hallberg Ö. A time dependent field return model for telecommunication hardware (Invited paper), IEEE/AST workshop, Boston, 1999.
17. Zhang Y, Das D, Katz K, Hallberg Ö (Co-author only). Trends in Semiconductor Component Reliability, Semiconductor International, pp. 101-106, Sept 1999.
18. Hallberg Ö, Larsson J. Product Performance Optimized Test Flow, IEEE AST Workshop, Oct 2-4, 2000 Denver, Colorado. Proceedings pp 381-389.
19. Grimvall G, Ljunggren O. Långtidsuppförandet hos tekniska system. Studentlitteratur, Kapitel 4: Örjan Hallberg, Uppskattning av elektronikkomponenters livslängd och möjliga kvalitetsvisnster, p47 ff (In Swedish)
    
    

Apart from this I have arranged 4 national conferences with internatinal speakers, guided 8 master thesis works and given presentations at national conferences not mentioned here.